by Castellano-Hernandez, E., Moreno-Llorena, J., Saenz, J. J. and Sacha, G. M.
Reference:
Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy (Castellano-Hernandez, E., Moreno-Llorena, J., Saenz, J. J. and Sacha, G. M.), In Journal of Physics-Condensed Matter, volume 24, 2012.
Bibtex Entry:
@article{RID:0211140916786-2,
title = {Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy},
journal = {Journal of Physics-Condensed Matter},
year = {2012},
author = {Castellano-Hernandez, E. and Moreno-Llorena, J. and Saenz, J. J. and Sacha, G. M.},
volume = {24},
number = {15}
}