by Castellano-Hernández, Elena, Moreno Llorena, Jaime, Saenz, J.J. and Gómez Moñivas, Sacha
Reference:
Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy (Castellano-Hernández, Elena, Moreno Llorena, Jaime, Saenz, J.J. and Gómez Moñivas, Sacha), In JOURNAL OF PHYSICS-CONDENSED MATTER, volume 24, 2012.
Bibtex Entry:
@article{castellano-hernandez_enhanced_2012,
title = "Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy",
volume = 24,
url = "http://dx.doi.org/10.1088/0953-8984/24/15/155303",
journal = "{JOURNAL} {OF} {PHYSICS-CONDENSED} {MATTER}",
author = "Castellano-Hernández, Elena and Moreno Llorena, Jaime and Saenz, {J.J.} and Gómez Moñivas, Sacha",
year = 2012,
note = 15
}